![]() DEVICE AND METHOD OF DETECTION OF PHOTONS AND CHARGED PARTICLES AND THE USE OF THEM (Machine-transla
专利摘要:
Device and method for detecting photons and charged particles and using them. A solution is detailed for the determination of events related to photons and charged particles useful in therapies that make use of methodologies related to hadronics. In one aspect of the invention there is a device that has a sandwich-type structure of photon detector panels (1) and charged particle detector panels (2) that can be conveniently associated with respective sensors. Also included is a method for detecting photons and charged particles that makes use of the aforementioned device. Finally, a specific use of the object of the invention in hadronic therapy is detailed. (Machine-translation by Google Translate, not legally binding) 公开号:ES2823949A1 申请号:ES201930972 申请日:2019-11-07 公开日:2021-05-10 发明作者:Llácer Gabriela Dolores Llosá;Llácer Carlos Lacasta;Toala John Barrio 申请人:Consejo Superior de Investigaciones Cientificas CSIC;Universitat de Valencia; IPC主号:
专利说明:
[0002] PHOTON AND CHARGED PARTICLE DETECTION DEVICE AND METHOD [0004] OBJECT OF THE INVENTION [0006] The object of the invention is framed in the technical field of physics, more specifically in the field of particle detection. [0008] BACKGROUND OF THE INVENTION [0010] Hadronic therapy has as one of its main drawbacks that there is no effective method to determine in real time if the radiation dose is being applied properly at the intended site. Detection of secondary particles that escape from tissue upon irradiation provides a method of monitoring therapy. Currently, positron emission tomography is the only method used, but it has serious drawbacks in terms of detection efficiency and performance, so alternative monitoring methods are being studied. [0012] One of these alternatives consists of detecting the gamma radiation emitted by the tissue. Currently there are different types of detectors under development for the purpose of detecting emitted gamma radiation, but they are not yet in use. Both collimated cameras and Compton cameras have been developed. [0014] The collimated cameras constitute a simple method, close to its clinical use, but not very efficient and that only provides a one-dimensional view of the variations in the application of the dose. [0016] Compton cameras are used or investigated for the detection and localization of radiation in different areas: astrophysics, national security, locating radioactive sources after nuclear disasters, medical imaging and, recently, in monitoring in hadronic therapy. In each case, they comprise detectors that must be optimized for a specific scenario. These types of cameras provide a more efficient monitoring method. However, its response is also limited due to the fact that a large number of events due to noise are detected in the clinical application environment, which degrade the signal, considering as an event an interaction of a charged particle or a photon of radiation with the detectors or detector panels. [0018] In Traini, Giacomo et al. Physica Medica: European Journal of Medical Physics, Volume 34, 18 - 27 details a device to detect the origin of charged secondary particles that are produced after the interaction of a beam of carbon ions with the patient's tissue, and relates the emission profile of these particles with the position of the Bragg peak and, therefore, with the radiation dose. This device is part of a larger machine that includes a PET (Positron Emission Tomography) detector. The charged particle detector is made up of a series of planes made of scintillation fibers coupled to SiPM (Silicon photomultipliers) and two more scintillators below. [0020] Document US2014110592, describes a Compton camera for image reconstruction that detects the particles generated in a Compton interaction (gamma radiation and electrons), also describing different modules with different arrangements, and the results are analyzed for the determination of the Compton cone. [0022] Document WO 2016140371 A1 describes a device with the ability to detect the energy trace ( tracking ) deposited by an electron emitted in the Compton interaction for a better determination of the direction of incidence of a gamma ray. The invention described in this document aims to solve the problem of the indeterminacy of the first interaction point of the gamma ray when multiple scattering occurs in the detector or when another gamma ray interacts simultaneously, and the electron detector is the same in which the first Compton interaction of the photon occurs. [0024] However, trace detection involves the use of precision (and often expensive) detectors, capable of detecting various electron interactions, and detectors that allow determining the trace generally have low photon detection efficiency. [0026] In document US 9535016 A1 the claimed system comprises a device to improve the efficiency of CT images (Computed Tomography) by using the scattered events in the patient. An electron detector is proposed in the document that detects the escape of electrons in order to rule out such events. [0027] In the system described in the previous document, the object to be imaged is located between the source and a gamma radiation detector panel. The photons of this invention must be of low energy, on the order of those used in CT, since it is intended that they interact with the object and be scattered in it. [0029] Given the low energies of the photons in this paper, the electrons emitted in the Compton interaction mostly do not escape the detector panel. If they do, they have low energies and are highly unlikely to hit the object or second detector. The problem that arises in this document, and for which it is proposed to add an electron detector, is that they take away part of the energy, which is not deposited in the detector, and thereby distort the measurement of the event. Thanks to the electron detector these events can be rejected. The electron detector pretends to reject such events, but the electrons do not interact on the object or with the second detector. [0031] None of the solutions present in the state of the art allows us to determine which of the recorded events are good and which are not, in order to discard the latter and improve the signal-to-noise ratio (SNR), without the need to reconstruct the trace. They also fail to be easily compatible with structural imaging and reconstruction methods, which would allow, in therapy applications, a better determination of the irradiated area and the tumor. [0033] In general, Compton detectors, and in particular those that obtain images using high-energy photons, detect a large number of background events that distort the images obtained. These events are produced both by incident particles in the first detector, other than the photons coming from the object, and by secondary particles generated when the photon interacts with the first detector or with successive detectors. [0035] These particles interact in the different detectors producing random coincidences that the system registers as good events, giving rise to a background of noise in the images. The number of these particles, and therefore of the background events, increases with the energy of the photons. [0037] The proposed invention aims to detect the background events produced by particles generated in the detectors, and additionally charged particles of any type (electrons, positrons, protons, ions, charged fragments), coming from radiation incident, so that they can be removed from the images, which none of the state-of-the-art Compton cameras do. In addition, it provides event information to improve the resolution of the device. [0039] DESCRIPTION OF THE INVENTION [0041] The object of the invention is aimed at improving the signal / noise ratio in a photon detector device, by detecting the charged particles incident or generated by the interaction of phototons, and can be used to monitor radiation dose in therapy. hadronic. [0043] The detector device of the first aspect of the invention comprises several detector planes, interspersing charged particle detectors and photon detectors, preferably from gamma radiation. [0045] In this way, the detector device of the first aspect of the invention makes it possible to distinguish between photons and charged particles, reducing the problem of background noise caused by charged particles, thus improving the SNR signal / noise ratio. [0047] Preferably, the detector device, in a first embodiment, consists of several detector planes that combine a central charged particle detector (such as a silicon detector, scintillating fibers), with two detectors optimized for the detection (Compton interaction) of photons. of high energy called first photon detector and second photon detector (between hundreds of keV and 10-20 MeV), the central charged particle detector being positioned between both photon detectors and interacting the photons in the photon detector panels. The charged particle detector makes it possible to determine whether the signals detected in the second photon detector correspond to the scattered photons in the first photon detector, or to charged particles. [0049] In an alternative embodiment, the device further comprises an upstream charged particle detector, preferably positioned between an incident radiation source and the first photon detector panel, and the central charged particle detector positioned downstream of the first photon detector panel, at a side opposite that of the charged particle detector panel above. Following the central charged particle detector panel is positioned the second photon detector panel. [0050] The central charged particle detector panel has the ability to detect charged particles generated by the interaction of photons in the first photon detector panel, generating a signal, giving the option to reject, as well as to take into account this information to reconstruct an event, contributing to determine more precisely the energy deposited in the first photon detector and if the event is valid or invalid. [0052] The charged particle detector panel above enables the detection of charged particles from incident radiation and distinguishes them from photons. [0054] In the present invention, it is intended to obtain an image of the photon emission distribution (by means of radiotracer, activation by external irradiation or because it is radioactive), such as the body of a patient, and therefore the object or patient itself the one that acts as a source of radiation and is located in front of the photon detector panel or the previous charged particle detector panel, depending on the embodiment. [0056] In the present invention, the photons are not intended to interact with the object, but with the first photon detector. The invention is useful in situations where there are charged particles striking the device or where the energy of the photons is sufficient to produce secondary particles, and which can cause increased noise in the image. [0058] Unlike other detectors with a similar application, the device of the alternative embodiment of the invention, which comprises two charged particle detector panels and two photon detector panels positioned in a sandwich-like structure, makes it possible to distinguish different types of particles, determine if the incident particle is a photon (valid event) or a charged particle (valid or invalid event). It also makes it possible to determine if the photons, after the interaction in each of the detectors, continue their trajectory or if the particles produced by the photon in the interaction with the detectors deposit all their energy in the detector, or escape. [0060] This detection capacity allows to reconstruct each event and determine which of the recorded events are good and which are not, in order to discard the latter and improve the signal-to-noise ratio (SNR), and thus the performance of the device of the invention with relative to existing or developing systems. [0061] In addition, the device is compatible with structural imaging and reconstruction methods, such as tomography (CT) and magnetic resonance imaging (MRI), which allows a better determination of the irradiated area and the tumor. [0063] A second aspect of the invention is therefore a method for detecting photons and charged particles. [0065] Likewise, the object of the invention, in a third aspect thereof, is directed to a use that allows to carry out a monitoring of the administration of the radiation dose in hadronic therapy based on the photons of the gamma radiation preferably, which emits tissue when irradiated. [0067] DESCRIPTION OF THE DRAWINGS [0069] To complement the description that is being made and in order to help a better understanding of the characteristics of the invention, according to a preferred example of a practical embodiment thereof, a set of drawings is attached as an integral part of said description. where, with an illustrative and non-limiting nature, the following has been represented: [0071] Figures 1A and 1B.- Show a schematic view of a first embodiment of the device object of the invention. [0073] Figure 2.- Shows a schematic view of a second embodiment of the device object of the invention. [0075] Figure 3.- Shows a schematic view of a third embodiment of the device object of the invention. [0077] Figure 4.- Shows a schematic view of a fourth embodiment of the device object of the invention. [0079] Figure 5.- Shows a schematic view of a fifth embodiment of the device object of the invention. [0081] Figure 6.- Shows a schematic view of a sixth embodiment of the device object of the invention. [0082] Figure 7.- Shows two graphs where the registered values of coincidences are appreciated as a function of the thickness of each Si detector of the charged particle detector, for incident photons of 3 MeV (left) and 6 MeV (right). [0084] Figure 8.- Shows two graphs showing the percentage of noise events that the charged particle detector is capable of detecting for incident photons of 3 MeV (left) and 6 MeV (right). [0086] Figure 9.- Shows two graphs where the percentages of primary photons (from the beam) that interact in the silicon for 3 MeV and 6 MeV on the left and right respectively can be seen. [0088] Figure 10.- Shows an example of noise reduction in a 2D image of a simulated Bragg peak. [0090] PREFERRED EMBODIMENT OF THE INVENTION [0092] In a first preferred embodiment of the device corresponding to a first aspect of the invention, which can be seen in Figure 1A, there is a device for detecting photons and charged particles, which has a sandwich-type structure, on which a source imposes radiation, in which there is, firstly, a first photon detector panel (11) that causes a Compton scattering of the incident photons, so that there is an increase in its wavelength, losing part of its energy before passing towards a next panel. [0094] Following the first photon detector panel (11), on a side opposite to that of the radiation source, there is a central charged particle detector panel (22), which detects charged particles generated by the interaction of photons in the first panel. photon detector (11), generating a signal, giving the option both to reject, and to take this information into account to reconstruct an event, helping to determine more precisely the energy deposited in the first photon detector panel (11) and whether the event is valid or invalid. With this, it is possible to improve the results of the device. [0096] Finally, in this first embodiment, the device comprises a second photon detector panel (12), following the central charged particle detector panel (22), on a side opposite to that of the incident source of radiation, in which they interact photons scattered in the first photon detector panel. The central charged particle detector panel (22) also makes it possible to distinguish whether the particles incident on the second photon detector panel (12) are photons or charged particles. [0098] Additionally, in a second embodiment, and as shown in Figure 1B, the device can comprise a front charged particle detector panel (21), preferably made of a material comprising Silicon, and located between the incident radiation source and the first photon detector panel (11), which detects charged particles, both from incident radiation and from the environment, generating a signal when the charged particles pass through said front detector panel (21). [0100] In a possible third embodiment of the invention, such as the one shown replicated in figure 2, the device also comprises the two photon detector panels (11, 12) with scintillating crystals (in this case of LaBr3, but it can be of LaBr3, CeBr3, or a CdTe or CZT semiconductor detector), and the front charged particle detector (21) and central charged particle detector (22), consisting of silicon detectors, a rear charged particle detector panel (23) , which detects charged particles of incident radiation that pass through the second photon detector panel (12), generating a signal. [0102] In an embodiment carried out by means of simulation, a beam of photons or electrons of 3/6 MeV is impinged and the events that give rise to signals are recorded in both photon detector panels (11, 12) in temporal coincidence , and it is studied whether silicon charged particle detectors (21,22) fulfill their function of helping to distinguish charged particles from photons, that is, valid events from background noise. [0104] In a fourth embodiment of the invention shown in Figure 3, the device further comprises a second central charged particle detector panel (22). [0106] In a fifth embodiment of the invention, the device further comprises a third photon detector panel (13). Between the three photon detector panels (11, 12, 13) a central charged particle detector panel (22) and a rear charged particle detector panel (23) can be arranged between the second and third photon detector panels (22, 23 ). Furthermore, an upstream charged particle detector panel (21) can be placed between the radiation source and the first photon detector panel (11) and / or a rear charged particle detector panel (26) downstream from the third photon detector panel. (13). [0107] Alternatively, in this fifth embodiment, as shown in figure 4, between the radiation source and the first photon detector panel (11), two previous charged particle detector panels (21) and two particle detector panels can be placed. central charged (22) between the first photon detector (11) and the second photon detector panel (12). Following the latter, two rear charged particle detector panels (23) are positioned. [0109] In a sixth alternative embodiment of the invention, shown in Figure 5, in addition to the elements of the first embodiment described in Figure 1B, the device comprises two pairs of lateral charged particle detectors (24). Each of the lateral charged particle detectors (24) of each pair is positioned on either side of either the first photon detector (11) or the second photon detector (12), perpendicular to them. In this way, they have the ability to detect charged particles of incident radiation that pass through the photon detector panels (11, 12) and that deviate from a path perpendicular to them. [0111] In a seventh embodiment of the invention, reflected in Figure 6, comprising all the elements of the first embodiment shown in Figure 1B, the device further comprises two pairs of aligned charged particle detectors (25), the detectors of each pair are positioned side by side, and each of the aligned charged particle detector pairs (25) are positioned downstream of the first photon detector (11) and the second photon detector (12). In this way, these detectors have the ability to detect charged particles that pass through the photon detector panels (11, 12) that deviate from the path perpendicular to them. [0113] Additionally, and in all the embodiments described above, the device may comprise a first signal detector associated with each photon detector (11,1 2, 13) and a second signal detector associated with each charged particle detector panel (21, 22, 23, 24, 25, 26). [0115] Two possible cases of implementation of the method object of a second aspect of the invention are provided in this document: a first case in which charged particles arrive at the device, and a second case in which gamma radiation hits the scintillator crystal of the first panel photon detector (11) and the secondary particles generated make the event invalid. [0116] To simulate the first case, the device of Figure 3 is impinged, which comprises four charged particle detector panels (21, 22, 23) between which each of the photon detector panels (11, 23) are respectively arranged. 12), a 3 MeV electron or gamma ray beam on the surface of the anterior charged particle detector panel (21), on the left in Figure 3. [0118] In this case, the photon detectors (11, 12) are made of LaBr3, 32 * 35mm2 and 10mm thick, 30 mm apart. The events that give rise to signals in both photon detectors (11, 12) in temporal coincidence are recorded and it is studied if the charged particle detectors (21, 22, 23) fulfill their function of helping to distinguish valid events from the background. noise. [0120] When analyzing the results, it is observed that 0.715% of the events produce interaction in the two photon detector panels (11, 12) in coincidence and therefore are registered by the device as potentially valid events. However, these events would correspond to noise, since the interaction is not due to photons. Of these, almost all the events (0.714%) produce a signal in the previous charged particle detector panel (21), which is located in front of the first photon detector panel (11) on the side of incidence of the radiation from the charged particle detector panel (11), so they are easily rejected. [0122] In order to illustrate the efficiency of the device in different situations, in the second case, various simulations were carried out, with 3 MeV or 6 MeV photon beams incident on the device and varying the thickness of the photon detectors ( 11, 12) between 50 microns and 1000 microns. [0124] The percentage of events detected in three cases is studied: [0126] In a first case, referred to in the graphs of figure 7, of a total of simulated events (1 million for each thickness of the charged particle detector panels (21, 22, 23)), depending on the thickness of the detector panels of charged particles (21,22, 23) for incident photons of 3 MeV and 6 MeV corresponding to the graph on the left and right respectively. The recorded values are suitable for two photon detector panels (11, 12) in coincidence with the dimensions and geometry studied, and include both good events and bad or noisy events. [0127] In a second case, referred to in the graphs of figure 8 for incident radiation photons of 3 MeV and 6 MeV, in the graph on the left and right respectively, among the events recorded as coincidences in each case, percentage of events of noise that the above charged particle detector panel (21) is capable of detecting. These noise events would degrade the response of the first photon detector (21), but thanks to the previous charged particle detector panel (21) they can be detected and eliminated from the analysis. [0129] In a third case, referred to in the graphs in figure 9, among the events recorded as coincidences in each case, the percentage of primary photons (from the incident radiation beam) that interact in the previous charged particle detector panel (21) (for 3 MeV and 6 MeV to the left and right respectively). These are unwanted noise events that are generated by including the previous charged particle detector panel (21) in the device. [0131] The object of the invention is capable of detecting, by means of the previous charged particle detector panel (21), a significant percentage of noise events that would degrade its response (practically all the incident charged particles and 20-30% of the registered matches), and can be deleted. The noise events generated when introducing the previous charged particle detector panel (21), which in turn can degrade the performance of the device, are kept at low levels. Therefore, performance is improved over devices incorporating only photon detector panels. [0133] Figure 10 shows the noise reduction in an image of a simulated Bragg peak. All events are included in the image on the left. In the image on the right, the events with interaction in Silicon have been eliminated. As can be seen in figure 10, thanks to the use of the present invention, there is a significant reduction in noise in the image. [0135] The images of figure 10 have been obtained with a device based on an embodiment like that of figure 3, in which there is a first photon detector panel (11) between two charged particle detector panels (21, 22), and a second photon detector panel (12) between two other charged particle detector panels (22, 23).
权利要求:
Claims (16) [1] 1. - Device for detecting photons and charged particles, characterized in that it comprises: - a first photon detector panel (11), which causes a Compton scattering of incident radiation with charged particles, so that an increase in its wavelength occurs, losing part of its energy, generating a signal, - a central charged particle detector panel (22), next to the first photon detector panel (11) on a side opposite to that of the incident radiation and that identifies charged particles generated in the first photon detector panel (11), generating a sign, and - a second photon detector panel (12), after the central charged particle detector panel (22), on a side opposite to that of the first photon detector panel (11), where the scattered photons and / or charged particles interact generated in the first photon detector panel (11), generating a signal. [2] 2. - The photon and charged particle detection device of claim 1, further comprising a front charged particle detector panel (21) located between the incident radiation and the first photon detector panel (11), which identifies charged particles incident radiation or the environment, generating a signal. [3] 3. - The photon and charged particle detection device of claim 2, further comprising a rear charged particle detector (23) that detects charged particles generated by the interaction of photons in the second photon detector panel (12). [4] 4. - The photon and charged particle detection device of claim 3, further comprising a second central charged particle detector panel (22). [5] 5. - The photon and charged particle detection device of claim 1, further comprising a third photon detector panel (13) positioned after the second photon detector panel (12), and a rear charged particle detector panel (23) positioned between the second photon detector panel (12) and the third photon detector panel (13). [6] 6. - The device for detecting photons and charged particles of claim 5, further comprising a front particle detector panel (21) positioned between the radiation source and the first photon detector panel (11). [7] 7. - The photon and charged particle detection device of claim 5, further comprising a rear charged particle detector panel (26) positioned after the third photon detector panel (13). [8] 8. - The photon and charged particle detection device of claim 5, further comprising a front particle detector panel (21) positioned between the radiation source and the first photon detector panel (11), and a detector panel rear charged particles (26) positioned below the third photon detector panel (13). [9] 9. - The photon and charged particle detection device of claim 4, further comprising a second front charged particle detector panel (21), a second rear charged particle detector panel (23), a third photon detector panel (13) following the rear particle detector panels (23), and two rear charged particle detector panels (26), following the third photon detector panel (13). [10] 10. - The photon and charged particle detection device of claim 2, further comprising pairs of lateral charged particle detectors (24), a first pair being positioned perpendicular to each side of the first photon detector (11) and a second pair perpendicular to each side of the second photon detector (12). [11] 11. - The photon and charged particle detection device of claim 2, further comprising pairs of aligned charged particle detectors (25), positioned the aligned charged particle detectors (15) of each pair aligned one next to each other. another, one of the pairs being positioned between the first photon detector (11) and the central charged particle detector (22), and a second pair positioned after the second photon detector (12). [12] 12. - The device for detecting photons and charged particles, according to any of the preceding claims, additionally comprising a first signal detector associated with each photon detector (11, 12, 13) and a second signal detector associated with each charged particle detector panel (21, 22, 23, 24, 25, 26). [13] 13. - The device for detecting photons and charged particles, according to any of the preceding claims, in which the photon detector panels (11, 12, 13) are detectors based on a scintillator material selected from LaBr3, CeBr3, GAGG or a semiconductor detector selected between CdTe and CZT. [14] 14. - Method for detecting photons and charged particles that makes use of the device described in any of the preceding claims, characterized in that it comprises the steps of: • determine a signal level in at least one of the charged particle detector panels (21, 22, 23, 24, 25, 26) by means of a signal detector, and • define as a negative event when the signal level determined in step above is other than 0. [15] 15. - Use of the device described in any one of claims 1 to 13 to monitor radiation doses in hadronic therapy. [16] 16. Use of the device described in any one of claims 1 to 13 for image reconstruction.
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同族专利:
公开号 | 公开日 ES2823949B2|2022-02-02| WO2021089899A1|2021-05-14|
引用文献:
公开号 | 申请日 | 公开日 | 申请人 | 专利标题 KR100994794B1|2008-05-08|2010-11-17|라드텍주식회사|A radiation detection module for digital radiography| EP2293112A1|2008-06-25|2011-03-09|National Institute of Radiological Sciences|Gamma-ray detector, radiation diagnostic device, tomographic device, and analysis method therefor| WO2011037945A2|2009-09-22|2011-03-31|Boss Physical Sciences Llc|Organic-scintillator compton gamma ray telescope| EP3056927A1|2013-10-10|2016-08-17|Waseda University|Compton camera| KR101866947B1|2016-12-09|2018-06-14|한국원자력연구원|Radiation transmission image apparatus removable image noise by compton scattering and method for removing image noise by compton scattering|
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申请号 | 申请日 | 专利标题 ES201930972A|ES2823949B2|2019-11-07|2019-11-07|DEVICE AND METHOD FOR THE DETECTION OF PHOTON AND CHARGED PARTICLES AND THEIR USE|ES201930972A| ES2823949B2|2019-11-07|2019-11-07|DEVICE AND METHOD FOR THE DETECTION OF PHOTON AND CHARGED PARTICLES AND THEIR USE| PCT/ES2020/070678| WO2021089899A1|2019-11-07|2020-11-04|Device and method for detecting photons and charged particles and use of same| 相关专利
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